PRINCIPLES OF MEASUREMENT SYSTEMS/JOHN P. BENTLEY
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TextPublication details: SINGAPORE LONGMAN SCIENTIFIC & TECHNICALDescription: 468 pISBN: - 0582237793
- QC 53 B4461p
| Cover image | Item type | Current library | Home library | Collection | Shelving location | Call number | Materials specified | Vol info | URL | Copy number | Status | Notes | Date due | Barcode | Item holds | Item hold queue priority | Course reserves | |
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| Libro de Reserva | Instituto Tecnológico de Culiacán | Sala de consulta | QC 53 B4461P (Browse shelf(Opens below)) | 1 | Not for loan | 34054 |
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| QC527 V217E ELECTRICIDAD BASICA -2/VAN VALKENBURGH | QC527 V217E ELECTRICIDAD BASICA -2/VAN VALKENBURGH | QC527 V217E ELECTRONICA BASICA:VOL. 2/VAN VALKENBURGH | QC 53 B4461P PRINCIPLES OF MEASUREMENT SYSTEMS/JOHN P. BENTLEY | QC532 Se683e ELECTRICIDAD Y MAGNETISMO ESTRATEGIAS PARA LA RESOLUCIÓN DE PROBLEMAS Y APLICACIONES | QC532 SE699F FISICA: ELECTRICIDAD Y MAGNETISMO | QC532 SE699F FISICA: ELECTRICIDAD Y MAGNETISMO |
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